Oct 22, 2019  
2016-2017 Undergraduate Catalog 
    
2016-2017 Undergraduate Catalog [NOTE!!!! THIS IS AN ARCHIVED CATALOG. FOR THE CURRENT CATALOG, GO TO CATALOG.NIU.EDU]

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ELE 434 - Semiconductor Material and Device Characterization


Study of fundamentals and principles of semiconductor material properties with applications to device characterization. Modern measurement techniques of semiconductor industry including electrical, optical, chemical, and physical methods.

Prerequisites & Notes
PRQ: ELE 335.

Credits: 3



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