Nov 24, 2024  
2009-2010 Graduate Catalog 
    
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2009-2010 Graduate Catalog [NOTE!!!! THIS IS AN ARCHIVED CATALOG. FOR THE CURRENT CATALOG, GO TO CATALOG.NIU.EDU]

ELE 634 - Integrated Circuit Design for Testability

Current methodologies and techniques for design of VLSI systems are introduced. Topics include the introduction to integrated circuit design; modeling integrated circuits at functional, structural, and physical levels; fault modeling and fault detection; testing; design for testability; built-in self test; and test pattern generation.

Prerequisites & Notes
PRQ: ELE 535 or consent of department.

Credits: 3