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Feb 04, 2023
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2017-2018 Graduate Catalog [NOTE!!!! THIS IS AN ARCHIVED CATALOG. FOR THE CURRENT CATALOG, GO TO CATALOG.NIU.EDU]
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ELE 634 - Integrated Circuit Design for Testability
Current methodologies and techniques for design of VLSI systems are introduced. Topics include the introduction to integrated circuit design; modeling integrated circuits at functional, structural, and physical levels; fault modeling and fault detection; testing; design for testability; built-in self test; and test pattern generation.
Prerequisites & Notes
PRQ: ELE 535 or consent of department.
Credits: 3
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