Nov 22, 2024  
2008-2009 Undergraduate Catalog 
    
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2008-2009 Undergraduate Catalog [NOTE!!!! THIS IS AN ARCHIVED CATALOG. FOR THE CURRENT CATALOG, GO TO CATALOG.NIU.EDU]

ELE 434 - Semiconductor Material and Device Characterization

Study of fundamentals and principles of semiconductor material properties with applications to device characterization. Modern measurement techniques of semiconductor industry including electrical, optical, chemical, and physical methods.

Prerequisites & Notes
PRQ: ELE 335 or consent of department.

Credits: 3